| Source comment | Flags set | Description |
|---|---|---|
SPURIOUS: |
||
| False in extended | 1 3 7 | Spurious detection associated with an extended emission |
| Wing of bright src | 1 7 | Spurious detection in the wings of a bright source |
| Out of time events | 1 7 | Spurious detection in out of time events |
| Diffraction spike | 1 7 | Spurious detection in RGA diffraction spike (MOS only) |
| Diffraction by RGA | 1 7 | Spurious detection in RGA diffraction spike (MOS only) |
| Bright pixel | 1 7 | Spurious detection due to bright (raw) pixel |
| Bright segment | 1 7 | Spurious detection in bright segments of a row or column |
| Corner of CCD | 1 6 7 | Spurious detection on the corner of a CCD (MOS only) |
| Bright corner of PW | 1 7 | Spurious detection due to bright corner area of MOS central partial window |
| Bright background | 1 7 | Spurious detection due to high background |
| Cosmic ray | 1 7 | Spurious detection due to cosmic ray |
| Reflection arc | 1 7 | Spurious detection on or near reflection arcs due to bright outside source |
| Bad background map | 1 7 | Spurious detection due to an area where the background spline map seems to fail |
| In bad background map region | 1 7 | Spurious detection due to an area where the background spline map seems to fail |
| Unknown | 1 7 | Source is part of a patch of low count sources, possibly due to problems with background subtraction |
PROBLEMATIC: |
||
| Split by CCD gap | 5 6 7 | Source split into two detections by CCD edge (brighter component) |
| Split by CCD gap | 1 6 7 | Source split into two detections by CCD edge (dimmer component) |
| Split by pileup | 5 6 7 | Source split into two or more detections by saturation of the source (brighter component) |
| Split by pileup | 1 6 7 | Source split into two or more detections by saturation of the source (dimmer component) |
| Possible multiple | 7 | Suspected multiple sources detected as a single source; count rate could be affected |
| Position offset | 5 7 | Source position offset from image peak |
| Near OOT events | 7 | Source near out of time events affecting count rate and/or position |
| Near bright segment | 7 | Source on or near bright segment affecting count rate and/or position |
| Near bright source | 7 | Source near wings of bright source affecting count rate and/or position |
| Near edge of field | (5) 6 7 | Source on edge of field of view possibly affecting count rate and/or position |
| Near bad col or pix | 7 | Source on edge of bad column/pixel affecting count rate and/or position |
| Near edge of CCD | (5) 6 7 | Source on CCD edge possibly affecting count rate and/or position |
| Near cosmic ray | 7 | Source on or near cosmic ray affecting count rate and/or position |
| Near reflection arc | 7 | Source on or near reflection arc due to bright outside source |
| Near diffraction spike | 7 | Source on or near RGA diffraction spike (MOS only) |
| Affected by optical loading | 7 | Source is near a hole due to optical loading affecting count rate and/or position |
| Core of ext emission | 3 7 | Source is at the core of the extended emission |
| Poss core of ext em | 7 | Source is possibly at the core of the extended emission |
| Possibly extended | 7 | Source is possibly extended |
| Poss false in ext | 3 7 | Source is possibly a spurious detection in extended emission area |
| In extended | 3 7 | Source is in extended emission area |
| Part of extended | 1 3 7 | Source is due to a clump within extended emission (not a point source, not core of the extended source) |
| none | 7 | (Source comment has been removed) |
| A | 7 | (Source comment has been removed) |
Note: All comments on spurious detections can be also given as a 'poss ...' with only flag 7 set.